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我正在测试一块使用LIS3MDL作为磁性参考传感器与3线SPI通信的电路板。我正在使用我制造的亥姆霍兹线圈测试传感器(顺便说一下,已经过测试并正确生成了磁场)。 当从LIS3MDL读取磁数据时,我看到磁数据正确地跟踪产生的磁场以获得正磁场。然而,负磁场未被正确测量并且在Breal对B测量的图中显示出不同的斜率。测量中的这个误差远远高于该器件预期的+ -0.12%非线性。 我测试了三个原型板,所有这些都有这个问题。我研究了来自传感器的原始二进制数据,我已经放弃了从二进制到高斯错误的任何转换。 最后,我的问题是:这种表现是否正常?三个传感器是否以同样的方式损坏?有没有人有同样的问题?我应该放弃并使用它吗? 谢谢! #spi 以上来自于谷歌翻译 以下为原文 Hi all, I am testing a board that uses a LIS3MDL as a magnetic reference sensor communicating with a 3-wire SPI. I am testing the sensor using a Helmholtz coil that I built (that, by the way, has been tested and generates correctly the magnetic field). When reading the magnetic data from the LIS3MDL I see that magnetic data tracks correctly the generated magnetic field for positive fields. However, negative magnetic fields are not correctly measured and show a different slope in a Breal vs B measured plot. This error in the measurement is far higher than the +-0.12% nonlinearity expected from this device. I have tested three prototype boards and all of them have this issue. I have studied the raw binary data coming from the sensor and I have discarded any conversion from binary to Gauss error. So finally, my question is: Is this performance normal? Are the three sensors damaged in the same way? Has anybody had the same problem? Should I give up and work with it? Thanks! #spi |
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小心使用此设备和ST上的其他几个SPI。如果您正在共享SPI总线,则芯片选择(CS)的概念无法正常工作。未选择时,此设备和其他设备实际上处于I2C模式。如果这些设备中的任何一个在共享SPI总线上看到它们各自的I2C从设备地址,它们可以并且将驱动SDI线路损坏与实际选择的设备之间的数据。我发现这很难。
以上来自于谷歌翻译 以下为原文 Be careful using this device and several others from ST over SPI. If you are sharing the SPI bus, the notion of Chip Select (CS) doesn't work right. This device and others, when NOT selected are actually in I2C mode. If any of these devices see their respective I2C slave addresses on the shared SPI bus, they can and will drive the SDI line corrupting data to/from the device that is actually selected. I found this the hard way. |
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